This subject focuses on the design, analysis, and characterization of fundamental semiconductor devices including diodes, transistors, and integrated circuit components. Students learn device physics, equivalent circuit models, performance parameters, and design considerations for various applications.
Students will design and analyze diode circuits and applications, understand bipolar and field-effect transistor operation principles, develop equivalent circuit models for device analysis, calculate key performance parameters and specifications, optimize device structures for specific applications, and troubleshoot device-related issues using measurement techniques.
Comprehensive study of different diode technologies, their construction, characteristics, and applications in rectification, voltage regulation, switching, and optoelectronics.
Analysis of junction and metal-oxide-semiconductor field-effect transistors, channel formation, threshold voltage, and transconductance characteristics.
Study of volatile and non-volatile memory structures, cell design, array organization, and access mechanisms for different memory types.
Study of NPN and PNP transistor construction, current components, operating modes, and basic amplifier configurations including common emitter, base, and collector.
Comprehensive coverage of MOSFET operation, short-channel effects, device scaling laws, and advanced MOSFET structures for improved performance.
Study of high-power, high-voltage semiconductor devices used in power electronics, motor drives, and energy conversion systems.
Comprehensive study of light-emitting diodes, photodetectors, solar cells, and laser diodes with emphasis on efficiency and performance optimization.
Development of equivalent circuit models, parameter extraction techniques, and simulation methodologies for device characterization and circuit design.
Study of devices optimized for microwave and millimeter-wave applications, focusing on speed, noise, and power considerations.
Study of pressure, temperature, acceleration, and other sensor types using semiconductor technology, including MEMS fabrication and packaging.
Hands-on training with I-V measurement systems, C-V analyzers, parameter analyzers, and specialized test equipment for device characterization.
Study of reliability testing, accelerated aging, failure analysis techniques, and design methods to enhance device reliability and yield.
Study of GaAs, InP, GaN, and other compound semiconductor materials and devices, including their advantages for specific applications.
Investigation of revolutionary device concepts that may replace or complement traditional silicon-based devices in future applications.